MATHMET

The European Centre for
Mathematics and Statistics in Metrology

Scientific journal papers

Scientific papers, guidelines, best-practice guides and relevant publications for mathematics and statistics in metrology are published by MATHMET members in various locations. In order to improve visibility of this work, MATHMET provides a searchable data base of relevant peer-reviewed scientific publications.

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Authors
Title
Journal
Year
C. Elster, W. Wöger and M.G. CoxAnalysis of Key Comparison Data: Unstable Travelling StandardsMeasurement Techniques 48, 883-8932005
P.H. Garthwaite, J.B. Kadane and A. O'HaganStatistical Methods for Eliciting Probability DistributionsJournal of the American Statistical Association 100, 680-7012005
A. G. Steele and R. J. DouglasChi-squared statistics for KCRV candidatesMetrologia 42, 2532005
T. Quinn and J. KovaleskyThe development of modern metrology and its role todayPhil. Trans. R. Soc. A 363, 2307-23272005
G.M. Rocha and G.A. KyriazisaA software for the evaluation of the stability of measuring standards using Bayesian statisticsIn Proceedings of the 13th International Symposium on Measurements for Industry Applications, 386-3912004
R.N. KackerCombining information from interlaboratory evaluations using a random effects modelMetrologia 41, 132-1362004
C.M. SuttonAnalysis and linking of international measurement comparisonsMetrologia 41, 272-2772004
D.R. WhiteOn the analysis of measurement comparisonsMetrologia 41, 122–131 2004
V. Wilkens, C. KochAmplitude and phase calibration of hydrophones up to 70 MHz using broadband pulse excitation and an optical reference hydrophoneThe Journal of the Acoustical Society of America2004
H. Källgren, M. Lauwaars, B. Magnusson, L. Pendrill and P. TaylorRole of measurement uncertainty in conformity assessment in legal metrology and tradeAccred. Qual. Assur. 8, 541-5472003
R. Kacker and A. JonesOn the use of Bayesian statistics to make the Guide to the Expression of Uncertainty in Measurement consistentMetrologia, 40, 235-2482003
M.G. CoxThe evaluation of key comparison dataMetrologia 39, 589-5952002
K. Weise and W. WögerRemoving model and data non-conformity in measurement evaluationMeasurement Science and Technology 11, 1649-16582000
BIPMMutual Recognition of National Measurement Standards and of Calibration and Measurement Certificates Issued by National Metrology Institutes (MRA)BIPM1999
BIPM, IEC, IFCC, ISO, IUPAC, IUPAP and OIMLGuide to the Expression of Uncertainty in MeasurementInternational Organization for Standardization, Geneva Switzerland1995
S. M. RiadThe deconvolution problem: An overviewProceedings of the IEEE1986
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